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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Chia-Hsiang Chen Yejoong Kim Zhengya Zhang Blaauw, D. Sylvester, D. Naeimi, H. Sandhu, S. |
| Copyright Year | 2011 |
| Description | Author affiliation: Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI (Chia-Hsiang Chen; Yejoong Kim; Zhengya Zhang; Blaauw, D.; Sylvester, D.) || Intel Corporation, Santa Clara, CA (Naeimi, H.; Sandhu, S.) |
| Abstract | We propose an adaptive reliability enhancement structure for deeply-scaled CMOS and future devices that exhibit nondeterministic behavior. This structure forms the basis of a confidence-driven computing model that can be implemented in either a rollback recovery or an iterative dual modular redundancy method incorporating synchronous handshake schemes. The performance and cost of the computing model are estimated using a 45 nm CMOS technology and the functionality is verified by FPGA-based emulation. The confidence-driven computing model is demonstrated using a 16-bit, 12-stage CORDIC processor operating under random, transient errors. The confidence-driven computing model adapts to the fluctuating error rates at the device substrate level to guarantee the reliability of computation at the system level. This computing model costs 4.2 times smaller area and 2.7 times less energy overhead than triple modular redundancy to guarantee a system-level mean time to failure of two years. |
| Starting Page | 1 |
| Ending Page | 6 |
| File Size | 170852 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781612842080 |
| ISSN | 15301591 |
| e-ISBN | 9783981080186 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-03-14 |
| Publisher Place | France |
| Access Restriction | Subscribed |
| Rights Holder | European Design Automation Association (EDAA) |
| Subject Keyword | Error analysis Redundancy Synchronization Delay Throughput Computational modeling dual modular redundancy reliability transient error confidence estimator rollback recovery |
| Content Type | Text |
| Resource Type | Article |
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