NDLI: As-Robust-As-Possible test generation in the presence of small delay defects using pseudo-Boolean optimization

Content Provider	IEEE Xplore Digital Library
Author	Eggersgluss, S. Drechsler, R.
Copyright Year	2011
Description	Author affiliation: Inst. of Comput. Sci., Univ. of Bremen, Bremen, Germany (Eggersgluss, S.; Drechsler, R.)
Abstract	Delay testing is performed to guarantee that a manufactured chip is free of delay defects and meets its performance specification. However, only few delay faults are robustly testable. For robustly untestable faults, non-robust tests which are of lesser quality are typically generated. Due to significantly relaxed conditions, there is a large quality gap between non-robust and robust tests. This paper presents a test generation procedure for As-Robust-As-Possible (ARAP) tests to increase the overall quality of the test set. Instead of generating a non-robust test for a robustly untestable fault, an ARAP test is generated which maximizes the number of satisfiable conditions required for robust test generation by pseudo-Boolean optimization. Additionally, the problem formulation is extended to incorporate the increased significance of small delay defects. By this, the likeliness that small delay defects invalidate the test is reduced. Experimental results on large industrial circuits confirm the quality gap and show that the generated ARAP tests satisfy a large percentage of all robustness conditions on average which signifies a very high quality.
Sponsorship	IEEE
Starting Page	1
Ending Page	6
File Size	116642
Page Count	6
File Format	PDF
ISBN	9781612842080
ISSN	15301591
e-ISBN	9783981080186
DOI	10.1109/DATE.2011.5763207
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-03-14
Publisher Place	France
Access Restriction	Subscribed
Rights Holder	European Design Automation Association (EDAA)
Subject Keyword	Robustness Delay Circuit faults Logic gates Optimization Integrated circuit modeling Testing
Content Type	Text
Resource Type	Article

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