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Content Provider | IEEE Xplore Digital Library |
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Author | Jingyan Chen Jie Yu Mori, J. Rashid, M.M. Gangshi Hu Honglu Yu Flores-Cerrillo, J. Megan, L. |
Copyright Year | 2013 |
Description | Author affiliation: Process & Syst. R&D, Praxair, Inc., Tonawanda, NY, USA (Gangshi Hu; Honglu Yu; Flores-Cerrillo, J.; Megan, L.) || Dept. of Chem. Eng., McMaster Univ., Hamilton, ON, Canada (Jingyan Chen; Jie Yu; Mori, J.; Rashid, M.M.) |
Abstract | The conventional principal component analysis (PCA) based pattern matching methods have been applied to dynamic process monitoring. However, they do not take into account the non-Gaussian features in industrial processes and are also more focused on fault detection instead of fault diagnosis. In this paper, an independent component analysis and mutual information based non-Gaussian pattern matching approach is developed for fault detection and diagnosis of complex chemical processes. The presented approach is applied to a simulated cryogenic air separation process and the application study demonstrates that the developed non-Gaussian pattern matching method can effectively monitor the complex air separation process with strong capability of fault detection and diagnosis. |
Starting Page | 2797 |
Ending Page | 2802 |
File Size | 259230 |
Page Count | 6 |
File Format | |
ISBN | 9781479901777 |
ISSN | 07431619 |
e-ISBN | 9781479901784 |
DOI | 10.1109/ACC.2013.6580258 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2013-06-17 |
Publisher Place | USA |
Access Restriction | Subscribed |
Rights Holder | American Automatic Control Council(AACC) |
Subject Keyword | Monitoring Pattern matching Fault detection Benchmark testing Mutual information Indexes Integrated circuits |
Content Type | Text |
Resource Type | Article |
Subject | Electrical and Electronic Engineering |
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