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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Oppermann, M. Heuer, H. Meyendorf, N. Wolter, K.-J. |
| Copyright Year | 2008 |
| Description | Author affiliation: Electron. Packaging Lab. (IAVT), Tech. Univ. Dresden, Dresden (Oppermann, M.; Wolter, K.-J.) || Fraunhofer Inst. for Non-Destruct. Testing, Dresden (Heuer, H.; Meyendorf, N.) |
| Abstract | The challenge of nano packaging requires new non-destructive evaluation (NDE) techniques to detect and characterize very small defects like transportation phenomenon, Kirkendall voids or micro cracks. Imaging technologies with resolutions in the submicron range are the desire. Possible evaluation methods are for example x-ray microscopy, x-ray tomography, ultrasonic microscopy and thermal microscopy. However, techniques with this resolution can not be found on the market. The ldquocenter for non-destructive nano evaluation of electronic packagingrdquo $(nanoeva^{reg})$ is taken up to develop this equipment in cooperation with the electronics industry and to transfer the knowledge to colleagues in industries and research institutions. The new center is a common organization of Fraunhofer IZFP-D and the electronics packaging lab with its centre of microtechnical manufacturing (ZmuP) of the Technische Universitat Dresden. |
| Starting Page | 1029 |
| Ending Page | 1034 |
| File Size | 23129034 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781424428137 |
| DOI | 10.1109/ESTC.2008.4684493 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-09-01 |
| Publisher Place | UK |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Ultrasonic imaging Image resolution Microscopy Electronics industry Transportation X-ray tomography Electronic packaging thermal management Optical imaging X-ray imaging Electronics packaging |
| Content Type | Text |
| Resource Type | Article |
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