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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Sun Sik Kim Keun Soo Kim Suganuma, K. Tanaka, H. |
| Copyright Year | 2008 |
| Description | Author affiliation: ISIR, Osaka Univ., Ibaraki (Sun Sik Kim; Keun Soo Kim; Suganuma, K.) || Kobe R&D Center, ESPEC Corp., Kobe (Tanaka, H.) |
| Abstract | Isotropic conductive adhesives (ICA), such as Ag-epoxy pastes, have been recognized as one of the ecological alternatives to lead-bearing solders in surface mount technology (SMT) applications. Although Ag-epoxy conductive adhesives possess many advantages as an alternative, they still have several drawbacks to be clarified. The present study shows the degradation mechanism of mounted chip components with Ag-epoxy conductive adhesives under two different environmental tests: the thermal cycle between -40 and 125degC and the humid exposure of 85degC/85%RH. The electrical resistance of the chip component circuits during both environmental tests increased with exposure time. Under the thermal cycles, micro-cracks were accumulated at the Sn/epoxy resin interface. In addition, there were no secondary phases such as oxides at the interface. On the other hand, under the humid atmosphere, thin Sn-oxide layers were formed inhomogeneously on the surface of Sn plating joined with Ag-epoxy conductive adhesives. The formation of additional defects at the joint interface, such as micro-cracks and Sn-oxide layers, causes the interfacial degradation of the mounted chip components. The detailed degradation mechanisms of the Ag-epoxy conductive adhesive joints are to be discussed. |
| Starting Page | 903 |
| Ending Page | 908 |
| File Size | 4915621 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781424428137 |
| DOI | 10.1109/ESTC.2008.4684472 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-09-01 |
| Publisher Place | UK |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Surface-mount technology Humidity Independent component analysis Tin Lead Thermal conductivity Circuit testing Conductive adhesives Thermal degradation Electric resistance |
| Content Type | Text |
| Resource Type | Article |
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