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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Chandran, U. Dan Zhao |
| Copyright Year | 2014 |
| Description | Author affiliation: Center for Adv. Comput. Studies, Univ. of Louisiana at Lafayette, Lafayette, LA, USA (Chandran, U.; Dan Zhao) |
| Abstract | In a three-dimensional stacked IC (3D-SIC), pre-bonding die tests are performed to test different functional components on dies as the yield of 3D-SIC highly depends on the quality of dies used for stacking. In observing the test challenges in pre-bonding, contactless wireless probing using inductive coupling has been introduced to provide high bandwidth test data transfer without the stress-induced damage. Aiming at high bandwidth high parallel pre-bonding test, a hybrid wireless test framework is established in this paper by utilizing such wireless probing techniques. Under the hybrid test framework, both IP cores and embedded TSVs are tested concurrently by applying scan methodology and BIST respectively. To exploit the performance-cost effectiveness of our new architecture, a test scheduling scheme is thereby proposed to optimize the test resource distribution and minimize test application time. The simulation study demonstrates the wireless test capability and the feasibility of a hybrid wireless test infrastructure. |
| Sponsorship | IEEE Circuits Syst. Soc. |
| Starting Page | 324 |
| Ending Page | 329 |
| File Size | 839552 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781479933785 |
| ISSN | 21641706 |
| DOI | 10.1109/SOCC.2014.6948948 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2014-09-02 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Wireless communication IP networks Resource management Propulsion Copper Transportation |
| Content Type | Text |
| Resource Type | Article |
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