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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Pardo, M. Sberveglieri, G. |
| Copyright Year | 2006 |
| Description | Author affiliation: CNR-INFM & Univ. of Brescia, Brescia (Pardo, M.; Sberveglieri, G.) |
| Abstract | Sensors practitioners don't make full use of the power of state-of-the-art pattern recognition (PR) algorithms and software. In this paper we apply -to our knowledge for the first time-Random Forests (RF) and Nearest Shrunken Centroids (NSC) to the classification of three E-Nose datasets of different hardness. We compare the classification rate with the one obtained by SVM. The classifiers parameters are optimized in an inner cross-validation (CV) cycle and the error is calculated by outer CV in order to avoid any bias. RF and SVM have a similar classification performance (SVM has an edge on the most difficult dataset). On the other hand, RF and NSC have an in-built feature selection mechanism that is very helpful for understanding the structure of the dataset and evaluating sensors. |
| Starting Page | 424 |
| Ending Page | 426 |
| File Size | 759698 |
| Page Count | 3 |
| File Format | |
| ISBN | 1424403758 |
| ISSN | 19300395 |
| DOI | 10.1109/ICSENS.2007.355496 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2006-10-22 |
| Publisher Place | South Korea |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Support vector machines Support vector machine classification Radio frequency Sensor systems Data analysis Sensor phenomena and characterization Statistical analysis Error analysis Packaging Pattern recognition |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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