NDLI: Shunt imaging in solar cells using low cost commercial liquid crystal sheets

Content Provider	IEEE Xplore Digital Library
Author	Ballif, C. Peters, S. Isenberg, J. Riepe, S. Borchert, D.
Copyright Year	2002
Description	Author affiliation: Fraunhofer ISE, Lab. & Service Centre Gelsenkirchen, Germany (Ballif, C.; Peters, S.)
Abstract	A simple low cost set-up to determine the location of shunts in solar cells has been developed. Our manual system can reproducibly detect all major shunts in large area reverse biased solar cells at a rate of 1 cell every 12 seconds and allows therefore the imaging of large numbers of cells in a short time. The system is based on the use of commercial liquid crystal sheets which are brought into thermal contact with the solar cell by vacuum. The colour change of the sheet is an indication of the local heating of the cell at shunt locations under reverse bias at typical voltages between -2 and -10 V. The detected shunts are the same as the ones found in lock-in infrared thermography at reverse bias. We discuss some of the system specifications and limitations and give several application examples, with a special emphasis on edge isolation.
Sponsorship	IEEE Electron Devices Soc
Starting Page	446
Ending Page	449
File Size	400474
Page Count	4
File Format	PDF
ISBN	0780374711
ISSN	10608371
DOI	10.1109/PVSC.2002.1190555
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2002-05-19
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Photovoltaic cells Costs Liquid crystals Infrared detectors Temperature distribution Temperature sensors Vacuum systems Voltage Degradation Heating
Content Type	Text
Resource Type	Article

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