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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Bragagnolo, J.A. Akita, J. Sato, H. Chikaki, Y. Hashimoto, T. Ito, M. Sugiyama, I. Shea, S.P. |
| Copyright Year | 2002 |
| Description | Author affiliation: NPC America Corp., Dumont, NJ, USA (Bragagnolo, J.A.; Akita, J.; Sato, H.) |
| Abstract | The contribution of breakage-induced yield losses in solar cell and module manufacturing costs is well understood. Breakage data and information about the solutions implemented by cell manufacturers have a proprietary nature and are much less well known. The emergence of equipment manufacturers serving many customers is enabling solutions that are of common interest to the industry to become better known. In this paper we discuss the cell handling requirements of crystalline silicon solar cell manufacturers and present data obtained with two machines designed and manufactured by the NPC Group and used in cell testing and module assembly operations. On this basis, we propose topics where industry collaboration with the research community could result in advantages for all cell manufacturers. |
| Sponsorship | IEEE Electron Devices Soc |
| Starting Page | 383 |
| Ending Page | 386 |
| File Size | 393950 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780374711 |
| ISSN | 10608371 |
| DOI | 10.1109/PVSC.2002.1190539 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2002-05-19 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Crystallization Silicon Photovoltaic cells Throughput Production Manufacturing industries Pulp manufacturing Costs Testing Assembly |
| Content Type | Text |
| Resource Type | Article |
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