NDLI: Investigation of thin aluminium films on the rear of monocrystalline silicon solar cells for back surface field formation

Content Provider	IEEE Xplore Digital Library
Author	Hartley, O.N. Russell, R. Heasman, K.C. Mason, N.B. Bruton, T.M.
Copyright Year	2002
Description	Author affiliation: BP Solar, Sunbury-on-Thames, UK (Hartley, O.N.; Russell, R.; Heasman, K.C.; Mason, N.B.; Bruton, T.M.)
Abstract	The trend to thinner crystalline silicon wafers in the production of silicon solar cells instigates a re-evaluation of the back surface field (BSF) formation. Aluminium layers, whose thickness is typically over 10 /spl mu/m, are commonly used for BSF formation. Such thick films, however, cause severe warping on thin solar cells (<250 /spl mu/m). This study investigates the use of thin Al films of between 0.1 and 2.0 /spl mu/m and focuses on the aluminium/rear surface structure after sintering in a mixed nitrogen and oxygen gas atmosphere at temperatures between 820/spl deg/C and 995/spl deg/C. It is shown that the rear surface morphology has a strong influence on the reaction of Al with Si. Secondary electron and focused ion beam microscopy reveal that thin Al layers form Al islands on smooth surfaces but the Al agglomerates at the apex of pyramids when the surface is textured. In both cases the Al dissolves the Si rear surface inhomogeneously. The structural results are correlated with electrical measurements of laser grooved buried contact solar cells. The correlation shows increasing short circuit current with increasing Al film thickness. The results are used to explain deviations of the standard theory of the Al:BSF formation when using thin Al films.
Sponsorship	IEEE Electron Devices Soc
Starting Page	118
Ending Page	121
File Size	550022
Page Count	4
File Format	PDF
ISBN	0780374711
ISSN	10608371
DOI	10.1109/PVSC.2002.1190470
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2002-05-19
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Aluminum Semiconductor films Silicon Photovoltaic cells Surface morphology Surface texture Crystallization Production Thick films Surface structures
Content Type	Text
Resource Type	Article

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