NDLI: A self optimizing autofocusing scheme for microscope integrated visual inspection systems

Content Provider	IEEE Xplore Digital Library
Author	Baran, E.A. Ayit, O. Santiago, V.B. Lopez-Doriga, S. Sabanovic, A.
Copyright Year	2013
Description	Author affiliation: Fac. of Eng. & Natural Sci., Sabanci Univ., Istanbul, Turkey (Baran, E.A.; Ayit, O.; Santiago, V.B.; Lopez-Doriga, S.; Sabanovic, A.)
Abstract	This paper presents the development and implementation of a new, computer controlled microscope setup targeted to be used as the inspection unit of a microfactory system. The presented design has two degrees of freedom responsible for changing the magnification and focus level over the image respectively. Following the discussion on mechanical design and production, the couplings observed in experiments between magnification and focus levels are analyzed. Originating from the infeasibility of modeling the maximum sharpness point (i.e. maximum focus point) for any arbitrary object, a self optimizing controller structure is proposed that can work for any magnification level set by the user. The proposed controller structure is validated by experiments to restore the maximum focus point while the magnification level is arbitrarily set by the user.
Sponsorship	IEEE Ind. Electron. Soc.
Starting Page	4043
Ending Page	4048
File Size	1058624
Page Count	6
File Format	PDF
ISBN	9781479902248
ISSN	1553572X
DOI	10.1109/IECON.2013.6699783
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-11-10
Publisher Place	Austria
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Microscopy Focusing Fasteners DC motors Acceleration Optimization Cameras
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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