NDLI: A non-invasive system for the measurement of the robustness of microprocessor-type architectures against radiation-induced soft errors

Content Provider	IEEE Xplore Digital Library
Author	Guzman-Miranda, H. Aguirre, M.A. Tombs, J.
Copyright Year	2008
Description	Author affiliation: Dept. de Ing. Electron., Univ. de Sevilla, Sevilla (Guzman-Miranda, H.; Aguirre, M.A.; Tombs, J.)
Abstract	In critical digital designs such as aerospace or safety equipment, radiation-induced upset events (SEE) can produce adverse effects, so the ability to compare the sensibility of various proposed solutions is desirable. As custom-hardened microprocessor solutions can be very costly, the reliability of various COTS (Commercial-Off-The-Shelf) processors can be evaluated, to see if there is a commercially available microprocessor or microprocessor-type IP (Intellectual Property) with adequate robustness for the specific application. Most existing approaches for the measurement of this robustness of the microprocessor involve diverting the program flow and timing to introduce the bit flips via interrupts and embedded handlers added to the application program. In this paper the tool FT-UNSHADES-uP is described, which provides an environment and methodology for the evaluation of the sensitivity of microprocessor architectures, using dynamic runtime fault injection. A case study is presented, where the robustness of a MicroBlaze and Leon3 uP systems executing a simple signal processing task written in C are evaluated and compared. A hardened version of the program where the key variables are protected has also been tested and its contributions to the system robustness have also been evaluated.
Starting Page	2009
Ending Page	2014
File Size	1728710
Page Count	6
File Format	PDF
ISBN	9781424415403
ISSN	10915281
DOI	10.1109/IMTC.2008.4547378
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-05-12
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Robustness Microprocessors Aerospace safety Radiation safety Safety devices Intellectual property Fluid flow measurement Timing Aerodynamics Runtime tolerance analysis Automated test microprocessor testing non-invasive measurement
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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