NDLI: A Novel Approach To Automated Testing To Increase Software Reliability

Content Provider	IEEE Xplore Digital Library
Author	Catelani, M. Ciani, L. Scarano, V.L. Bacioccola, A.
Copyright Year	2008
Description	Author affiliation: Dept. of Electron. & Telecommun., Univ. of Florence, Florence (Catelani, M.; Ciani, L.; Scarano, V.L.; Bacioccola, A.)
Abstract	Software plays an increasingly important role in equipment and systems, both in terms of technical relevance and of development cost (often higher than 50% even for small systems). Unlike HW, SW does not go through a production phase. Also, SW cannot break or wear out. However, it can fail to satisfy its required function because of defects which manifest themselves while the system is operating (dynamic defects). A fault in the SW is thus caused by a defect, even if appears randomly in time, and SW problems are basically quality problems which have to be solved with quality assurance tools (configuration management, testing, and quality data reporting systems). In order to grant a software high quality level against a reasonable cost, the testing planning phase has to be study in detail. In order to do so, an adequate coverage of the product functionality has to be supplied to reduce the test time. The aim of the paper is suggesting an automated software testing as a solution to the problem of having to maximize the test plan coverage within the available time and to increase software reliability and quality in use.
Starting Page	1499
Ending Page	1502
File Size	2229176
Page Count	4
File Format	PDF
ISBN	9781424415403
ISSN	10915281
DOI	10.1109/IMTC.2008.4547280
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-05-12
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Automatic testing Software testing Software reliability System testing Production Costs Electronic equipment testing Reliability engineering Instrumentation and measurement Quality assurance memory leaks software reliability software testing regression test automated software testing
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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