NDLI: Multimodal Solution for a Rectangular Waveguide Radiating into a Multilayered Dielectric Structure and its Application for Dielectric Property and Thickness Evaluation

Content Provider	IEEE Xplore Digital Library
Author	Ghasr, M.T. Zoughi, R.
Copyright Year	2008
Description	Author affiliation: Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO (Ghasr, M.T.; Zoughi, R.)
Abstract	Open-ended rectangular waveguides are widely used for microwave and millimeter wave nondestructive testing applications. Applications have included detecting disbonds and delaminations in multilayered composite structures, thickness evaluation of dielectric sheets and coatings on metal substrates, etc. When inspecting a complex multilayered composite structure, made of generally lossy dielectric layers with arbitrary thicknesses and backing, the dielectric properties of a particular layer within the structure is of particular interest, such being health monitoring of structures such as radomes. The same is also true where one may be interested in the thickness or more importantly thickness variation of a particular layer within such structures. An essential tool for estimating the dielectric constant or thickness is an accurate model for simulating reflection coefficient at the aperture of the probing open-ended waveguide. One issue of interest is that radiation from open-ended rectangular waveguides into layered dielectric structures has been considered only when accounting for the dominant waveguide mode. However, when using these models for recalculating dielectric constant or thickness, the results may not be accurate (depending on the measurement requirements). To this end, this paper provides an accurate model for the reflection coefficient which also accounts for the effect of higher-order modes. Finally, the potential of this model for accurately estimating dielectric constant is shown.
Starting Page	552
Ending Page	556
File Size	1414475
Page Count	5
File Format	PDF
ISBN	9781424415403
ISSN	10915281
DOI	10.1109/IMTC.2008.4547098
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-05-12
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Rectangular waveguides Dielectric substrates Dielectric losses Dielectric constant Reflection Nondestructive testing Delamination Coatings Monitoring Apertures thickness open-ended waveguide stratified dielectric medium higher-order modes dielectric constan
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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