NDLI: Influence of temperature effects on sensitivity of surface plasmon resonance sensors

Content Provider	IEEE Xplore Digital Library
Author	Moreira, C.S. Lima, A.M.N. Neff, H.
Copyright Year	2008
Description	Author affiliation: Dept. of Electron., CEFET-AL, Maceio (Moreira, C.S.)
Abstract	The variation of instrumental sensitivity as function of environmental temperature of a surface plasmon resonance (SPR) sensor has been exploited here experimentally and theoretically for both, angular and wavelength interrogation modes (AIM, WIM). A compact, robust commercial SPR device has been used, operating in the AIM at the range 275 K < T < 320 K At temperature < 300 K, S steadily deteriorates from 120 to 30 deg/RIU (refractive index unit). A singularity has been identified in the simulations, based on analytical and numerical approaches, near the freezing point of water, while a soft transition appears in the experiment. Towards higher device temperatures at 300 K < T < 370 K, instrumental sensitivities for both AIM and WIM decreases weakly. The effect is more pronounced at shorter wavelength les 550 nm, and in the WIM. A steady increase towards higher T was observed for the SPR-line broadening parameter in the AIM, but a distinct maximum resolved at 305 K for wavelength interrogation.
Starting Page	170
Ending Page	175
File Size	437512
Page Count	6
File Format	PDF
ISBN	9781424415403
ISSN	10915281
DOI	10.1109/IMTC.2008.4547025
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-05-12
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Temperature sensors Plasmons Resonance Optical sensors Instruments Silver Biosensors Optical films Spectroscopy Optical surface waves Drude Model Surface Plasmon Resonance Line broadening Temperature Dependence
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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