NDLI: A De-Embedding Technique for On-Wafer Simultaneous Impedance and Power Flow Measurements

Content Provider	IEEE Xplore Digital Library
Author	El-Deeb, W.S. Bensmida, S. Ghannouchi, F.M.
Copyright Year	2008
Description	Author affiliation: Dept. of Electr. & Comput. Eng., Calgary Univ., Calgary, AB (El-Deeb, W.S.; Bensmida, S.; Ghannouchi, F.M.)
Abstract	An absolute de-embedding technique for simultaneous impedance and power measurements suitable for on-wafer load-pull measurements of microwave transistors is proposed. This technique allows for the performance of a two-port power calibration of a vector network analyzer directly from the embedded reflection coefficient measurements. This method requires two sets of calibration standards, - one coaxial and one coplanar. Each set is comprised of three loads. An absolute power calibration performed at the coaxial reference planes using a reference power meter is also required for power measurement purposes at the coplanar reference planes of the microwave probes.
Starting Page	58
Ending Page	61
File Size	1203501
Page Count	4
File Format	PDF
ISBN	9781424415403
ISSN	10915281
DOI	10.1109/IMTC.2008.4547004
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-05-12
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Load flow Impedance measurement Power measurement Fluid flow measurement Calibration Coaxial components Microwave measurements Microwave theory and techniques Microwave transistors Performance analysis error box de-embedding absolute power calibration VNA
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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