NDLI: Improved Reliability Analysis Tool (ReAl) for lifetime analysis of CMOS circuits

Content Provider	IEEE Xplore Digital Library
Author	Kumar, A. Bhojani, P.
Copyright Year	2015
Description	Author affiliation: Dept. of Electron. & Commun., Marwadi Educ. Found. Group of Instn., Rajkot, India (Kumar, A.; Bhojani, P.)
Abstract	The reliability issues like Negative Bias Temperature Instability and Hot Carrier Injection are major concerns in nanoscale design of MOSFET applications. This necessitates that model with higher accuracy for prediction of these degradations and to calculate the lifetime of the CMOS application circuits. Earlier models available in literature are reported to be accurate but the huge time is consumed in evaluating these effects. Hence, we were motivated to propose extended & new models, which evaluate much faster than the available models. We propose a methodology, which uses these models and simulates the circuit degradation due to the effect of NBTI and HCI in CMOS circuit design, and subsequently predicts the lifetime of the circuit. This tool, which we call as Reliability Analysis Tool (ReAl) uses computational support of MATLAB, whereas utilizing accuracy of SPICE simulation for model building, and integrates both in order to provide the lifetime of the CMOS circuit under consideration.
Starting Page	768
Ending Page	771
File Size	348070
Page Count	4
File Format	PDF
e-ISBN	9781479972258
DOI	10.1109/ECS.2015.7125015
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-02-26
Publisher Place	India
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Human computer interaction Semiconductor device modeling Degradation NBTI (Negative Bias Temperature Instability) HCI (Hot Carrier Injection) Mathematical model Integrated circuit modeling Stress MOS devices
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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