NDLI: 1-bit compressed sensing based framework for built-in resonance frequency prediction using on-chip noise sensors

Content Provider	IEEE Xplore Digital Library
Author	Tao Wang Jinglan Liu Cheng Zhuo Yiyu Shi
Copyright Year	2015
Description	Author affiliation: Intel Corp., Hillsboro, OR, USA (Cheng Zhuo) \|\| ECE Dept., Missouri Univ. of Sci. & Technol., Rolla, MO, USA (Tao Wang; Jinglan Liu; Yiyu Shi)
Abstract	Significant noise will occur when the load currents of a chip contain frequency components that are close to its resonance frequency, which is mainly decided by power delivery network (PDN) capacitance and package inductance. Yet with technology scaling, the wire parasitic capacitance, which suffers from large process variations, starts to become a dominant contributor in the PDN capacitance, leading to a large resonance frequency variation across dies. It is thus important to know the resonance frequency of individual chips to effectively avoid resonance noise at runtime. Existing methods are mostly based on frequency sweeping, which are too expensive to apply to individual chips. In this paper, we propose a novel framework to predict the resonance frequency using existing on-chip noise sensors, based on the theory of 1-bit compressed sensing. Experimental results on industrial designs show that compared with frequency sweeping, our proposed framework can achieve up to 7.6× measurement time reduction under the same accuracy, with 15% resonance frequency variation. To the best of the authors knowledge, this is the very first work to point out the need of as well as a practical solution to the resonance frequency prediction for individual chips.
Starting Page	721
Ending Page	728
File Size	1544529
Page Count	8
File Format	PDF
e-ISBN	9781467383882
DOI	10.1109/ICCAD.2015.7372641
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-11-02
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Resonant frequency Capacitance Wires Frequency measurement Sensors Impedance Semiconductor device measurement
Content Type	Text
Resource Type	Article

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1-Bit Compressed Sensing Based Framework for Built-in Resonance Frequency Prediction Using On-Chip Noise Sensors

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