NDLI: Fast Lagrangian Relaxation based gate sizing using multi-threading

Content Provider	IEEE Xplore Digital Library
Author	Sharma, A. Chinnery, D. Bhardwaj, S. Chu, C.
Copyright Year	2015
Description	Author affiliation: Mentor Graphics, Mentor, OH, USA (Chinnery, D.; Bhardwaj, S.) \|\| Iowa State Univ. Comput. Eng., IA, USA (Sharma, A.; Chu, C.)
Abstract	We propose techniques to achieve very fast multi-threaded gate-sizing and threshold-voltage swap for leakage power minimization. We focus on multi-threading Lagrangian Relaxation (LR) based gate sizing which has shown both better power savings and better runtime compared to other gate sizing approaches. Our techniques, mutual exclusion edge assignment and directed graph-based netlist traversal, maximize thread execution efficiency to take full advantage of the inherent parallelism when solving the LR subproblem, without compromising the leakage power savings. With 8 threads, our multi-threading techniques achieve on average 5.23x speedup versus our single-threaded (sequential) implementation. This compares well to the maximum achievable speedup of 5.93x by Amdahl's law due to 5% of the execution not being parallelizable. To highlight the problems with load imbalance and poor scheduling, we also propose a simpler approach based on clustering and topological levelby-level netlist traversal, which can achieve only 3.55x speedup. We also propose three simple yet effective enhancements - fast optimal local resizing, early exit policy, and fast greedy timing recovery - to speed up single-threaded LR-based gate-sizing without degrading the leakage power. We test our gate sizer using the ISPD 2012 gate sizing contest benchmarks and guidelines. Compared to other researchers' state-of-the-art LR-based gate sizer, our approach is 1.03x (with 1-thread) and 5.40x (with 8-threads) faster and only 2.2% worse in leakage power.
Starting Page	426
Ending Page	433
File Size	1670384
Page Count	8
File Format	PDF
e-ISBN	9781467383882
DOI	10.1109/ICCAD.2015.7372601
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-11-02
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Logic gates Delays Runtime Capacitance Benchmark testing Libraries
Content Type	Text
Resource Type	Article

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