NDLI: A cocktail approach on random access scan toward low power and high efficiency test

Content Provider	IEEE Xplore Digital Library
Author	Shih Ping Lin Chung Len Lee Chen, J.E.
Copyright Year	2005
Description	Author affiliation: Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsin Chu, Taiwan (Shih Ping Lin; Chung Len Lee; Chen, J.E.)
Abstract	Scan design, providing a good test solution to sequential circuits, suffers large data volume, long test time and high test power problem. Recently, the random access scan (RAS) scheme offers a solution to alleviate the above problems (Baik et al., 2004). In this paper, based on RAS, a cocktail scan scheme is proposed and demonstrated to improve the test efficiency significantly. The scheme adopts a two-phase approach, firstly by using a cycle random scan test with a few random seed patterns to test the DUT and secondly, by using the RAS mechanism to test the circuit. Due to employment of a revised process and several strategies, namely, test response abundant, constrained static compaction, and bit propagation before test vector dropping, it is very effective in reducing bit flipping and test data volume, consequently, the test application time and power. Experimental results show that the scheme can achieve 86% reduction in test data volume and 10 times of speedup in test application time.
Starting Page	94
Ending Page	99
File Size	257515
Page Count	6
File Format	PDF
ISBN	078039254X
DOI	10.1109/ICCAD.2005.1560046
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-11-06
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Electronic equipment testing Sequential analysis Built-in self-test Data engineering Design engineering Power engineering and energy Sequential circuits Employment Compaction
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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