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| Content Provider | IEEE Xplore Digital Library | 
|---|---|
| Author | Fang Liu Ozev, S. Brooke, M. | 
| Copyright Year | 2004 | 
| Description | Author affiliation: Duke Univ., Durham, NC, USA (Fang Liu; Ozev, S.; Brooke, M.) | 
| Abstract | With increasing uncertainties in the modeling and processing of semiconductor devices, it is essential that the sources of failures be identified once the devices are manufactured. We present a methodology to diagnose the problems in broadband amplifiers by determining the most important small signal parameters of the internal transistors. We use an evolutionary algorithm specifically designed to mimic the expected errors to ensure fast convergence to the correct solution. Sensitivity analysis is used to determine the set of the most impactful small signal parameters and to guide the evolutionary search. Experimental results indicate the proposed algorithm determines the parameters accurately and it scales well in terms of accuracy and computation time. | 
| Starting Page | 641 | 
| Ending Page | 647 | 
| File Size | 576236 | 
| Page Count | 7 | 
| File Format | |
| ISBN | 0780387023 | 
| ISSN | 10923152 | 
| DOI | 10.1109/ICCAD.2004.1382654 | 
| Language | English | 
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) | 
| Publisher Date | 2004-11-07 | 
| Publisher Place | USA | 
| Access Restriction | Subscribed | 
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) | 
| Subject Keyword | Broadband amplifiers Scattering parameters Semiconductor devices Manufacturing processes Virtual manufacturing Semiconductor device manufacture Evolutionary computation Algorithm design and analysis Error correction Sensitivity analysis | 
| Content Type | Text | 
| Resource Type | Article | 
| Subject | Computer Graphics and Computer-Aided Design Computer Science Applications Software | 
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