NDLI: Mechanical behavior of ceramic capacitors

Content Provider	IEEE Xplore Digital Library
Author	Koripella, C.R.
Copyright Year	1991
Description	Author affiliation: KEMET Electron. Corp., Greenville, SC, USA (Koripella, C.R.)
Abstract	Fracture toughness, modulus rupture, and thermal shock resistance were evaluated on COG, X7R, and Z5U type commercial ceramic capacitors with and without internal electrodes. Results show that the fracture toughness values for all the dielectrics are very similar, close to 1 MPa m/sup 1/2/. Relatively, COG dielectrics are slightly stronger, followed by the X7R and Z5U dielectrics. Dielectric type, sample size, presence of electrodes, and the fired chip surface condition all affect the modulus of rupture values of the ceramic capacitor. COG capacitors showed the highest strength values and X7R capacitors showed narrow distributions in strength. Thermal shock resistance measurements were made by heating the samples to different temperatures and then suddenly quenching them in water, followed by strength measurements. Critical temperature differences for fracture initiation for different dielectrics were determined from these results and compared with the thermal shock resistance parameters for fracture initiation. Results show that the critical temperature difference for fracture initiation is close to 125 degrees C for 1206 size Z5U and 150 degrees C for X7R and COG dielectrics.<>
Starting Page	457
Ending Page	462
File Size	515115
Page Count	6
File Format	PDF
ISBN	0780300122
DOI	10.1109/ECTC.1991.163916
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1991-05-11
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Ceramics Capacitors Dielectrics Thermal resistance Electric shock Electrodes Electrical resistance measurement Temperature Surface cracks Surface resistance
Content Type	Text
Resource Type	Article

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