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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Lerong Cheng Jinjun Xiong Lei He |
| Copyright Year | 2008 |
| Description | Author affiliation: Univ. of California, Los Angeles (Lerong Cheng) |
| Abstract | In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus developed to estimate timing distribution under process variation. However, most of the existing SSTA techniques have difficulty in handling the non-Gaussian variation distribution and non-linear dependency of delay on variation sources. To solve such a problem, in this paper, we first propose a new method to approximate the max operation of two non- Gaussian random variables through second-order polynomial fitting. We then present new non-Gaussian SSTA algorithms under two types of variational delay models: quadratic model and semi-quadratic model (i.e., quadratic model without crossing terms). All atomic operations (such as max and sum) of our algorithms are performed by closed-form formulas, hence they scale well for large designs. Experimental results show that compared to the Monte-Carlo simulation, our approach predicts the mean, standard deviation, and skewness within 1%, 1%, and 5% error, respectively. Our approach is more accurate and also 20times faster than the most recent method for non-Gaussian and nonlinear SSTA. |
| Starting Page | 298 |
| Ending Page | 303 |
| File Size | 281642 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781424419210 |
| DOI | 10.1109/ASPDAC.2008.4483962 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-03-21 |
| Publisher Place | South Korea |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Timing Polynomials Random variables CMOS technology Delay lines Fitting Uncertainty Circuit optimization Integrated circuit technology Semiconductor process modeling |
| Content Type | Text |
| Resource Type | Article |
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