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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Dongyi Zhou Wenbiao Wu Dengren Jin Jinrong Cheng Zhongyan Meng |
| Copyright Year | 2007 |
| Description | Author affiliation: Shanghai Univ., Shanghai (Dongyi Zhou; Wenbiao Wu; Dengren Jin; Jinrong Cheng; Zhongyan Meng) $Pb0.3Sr0.7TiO_3$(PST) thin films were deposited on Pt coated Si(100) substrates by sol-gel techniques using different sol-concentrations. The structural and dielectric characteristics of PST thin films as a function of the sol-concentration were investigated. PST thin films reveal a columnar texture through the thickness when the sol-concentration is lower than 0.3 M. PST thin films derived from 0.35 M sol show better dielectric characteristics with the dielectric constant, dielectric loss, tunability and FOM of 206, 0.01009, 47.5% and 47.07, respectively. The temperature dependence of the dielectric constant, dielectric loss and tunability of PST thin films were investigated in the temperature range of -140~120 exhibiting a dielectric peak of around -45 . |
| Starting Page | 767 |
| Ending Page | 769 |
| File Size | 1232629 |
| Page Count | 3 |
| File Format | |
| ISBN | 9781424413331 |
| ISSN | 10994734 |
| DOI | 10.1109/ISAF.2007.4393396 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-05-27 |
| Publisher Place | Japan |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Dielectric thin films Dielectric losses Dielectric substrates Dielectric devices Dielectric constant Strontium Sputtering Temperature dependence Thin film devices Binary search trees |
| Content Type | Text |
| Resource Type | Article |
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