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Content Provider | IEEE Xplore Digital Library |
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Author | Alford, N.M. Button, T.W. Peterson, G.E. Smith, P.A. Davis, L.E. Penn, S.J. Lancaster, M.J. Wu, Z. Gallop, J.C. |
Copyright Year | 1965 |
Abstract | The surface resistance R/sub s/ of YBa/sub 2/Cu/sub 3/O/sub 7/ (YBCO) has been measured by means of a coaxial method using a copper outer shield and an HTS (high-temperature superconductor) central conductor as well as by means of an all-YBCO TE/sub 011/, cavity. The microstructure of the ceramic deliberately altered so that variables such as starting powder size and phase purity, ceramic density, phase composition, grain size, and number of grain boundaries can be evaluated. A number of experiments have been conducted so that the variables chosen might be studied independently. The results show that R/sub s/ varies in a complex manner according to the microstructure and that as sintered grain size is reduced to a certain size the R/sub s /is reduced. Further decreases in grain size are associated with an increase in the number of grain boundaries and an increase in the R/sub s/, suggesting that grain boundary detritus and grain boundaries themselves are sources of loss. The R/sub s/ is also highly dependent oil crystallographic orientation, and examples are given to show that R/sub s/ diminishes in c-axis-oriented YBCO thick films. |
Sponsorship | IEEE Magnetics Society |
Starting Page | 1510 |
Ending Page | 1518 |
Page Count | 9 |
File Size | 792862 |
File Format | |
ISSN | 00189464 |
Volume Number | 27 |
Issue Number | 2 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 1991-03-01 |
Publisher Place | U.S.A. |
Access Restriction | One Nation One Subscription (ONOS) |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Surface resistance Thick films Grain boundaries Grain size Yttrium barium copper oxide High temperature superconductors Microstructure Ceramics Electrical resistance measurement Coaxial components |
Content Type | Text |
Resource Type | Article |
Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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