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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Gallop, J.C. Radcliffe, W.J. Button, T.W. Alford, N.M. |
| Copyright Year | 1965 |
| Abstract | Measurements of the surface resistance R/sub s/ of a number of modes of a coaxial cavity for which the center conductor is a BiSrCaCuO (BSCCO) rod have been made. Results for R/sub s/(T) have allowed a quantitative estimate to be made of the proportions of two different phases present in this material. The variation of R/sub s/(T) with applied DC magnetic field has also been measured for fields below about 1 mT. The results are interpreted in terms of two simple models for microwave loss in bulk high-temperature superconductors. It is concluded that the measurement of microwave surface impedance for high-temperature superconducting specimens can be used to make quantitative estimates of the proportions of various discrete superconducting phases, provided each has a distinguishably different T/sub c/. The apparent concentration at the surface of the high-T/sub c/ phase, believed to be Bi/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub 10/, has not been previously reported and may have significance for applications of these materials. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 1310 |
| Ending Page | 1312 |
| Page Count | 3 |
| File Size | 295844 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 27 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1991-03-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Surface impedance Coaxial components Surface resistance Conducting materials Magnetic field measurement High temperature superconductors Phase estimation Superconducting microwave devices Electrical resistance measurement Bismuth compounds |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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