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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Lathrop, D.K. Russek, S.E. Moeckly, B.H. Chamberlain, D. Pesenson, L. Buhrman, R.A. Shin, D.H. Silcox, J. |
| Copyright Year | 1965 |
| Abstract | Thin-film YBa/sub 2/Cu/sub 3/O/sub 7/ microbridges have been fabricated by photo- and e-beam lithography in polycrystalline thin films grown on MgO substrates and containing a controlled density of large-angle tilt boundaries, thereby isolating individual tilt-boundary weak links. Depending on the growth parameters of the film, such weak links have critical current densities J/sub c/ ranging from <10/sup 4/ A mod cm/sup 2/ to >10/sup 6/ A mod cm/sup 2/. The higher J/sub c/ microbridges exhibit behavior indicative of one-dimensional flux flow and flux creep in the weak links, while the lower J/sub c/ microbridges have RSJ-like properties. Detailed comparisons have been made between the predictions of the resistively shunted junction (RSJ) model including the calculated effects of thermal noise rounding and the measured DC and microwave response of these weak links. Measurements have also been made of magnetic field effects on the critical current density. An unexpected scaling behavior has been observed in the I-V characteristics of certain types of these microbridges containing 45 degrees tilt boundaries that indicates that in those cases I/sub C/R/sub N//sup 2/ is a constant for the tilt-boundary weak link. The implications of these results for developing a successful description of the superconductive properties of YBa/sub 2/Cu/sub 3/O/sub 7/ grain boundary weak links, which electron microscopy reveals to be clean, stoichiometric, and abrupt, are discussed. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 3203 |
| Ending Page | 3208 |
| Page Count | 6 |
| File Size | 737895 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 27 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1991-03-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Magnetic field measurement Transistors Critical current density Lithography Substrates Creep Predictive models Thermal resistance Magnetic noise Superconducting device noise |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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