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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Takeuchi, T. Kosuge, M. Iijima, Y. Hasegawa, A. Kiyoshi, T. Inoue, K. |
| Copyright Year | 1965 |
| Abstract | In addition to microstructural studies, various characteristics of Nb tube processed Nb/sub 3/Al multifilamentary (MF) conductors needed in designing superconducting magnets are described. With decreasing Al core diameters of the Nb/Al composite, the formation rate of the A15 phase increased, and its lattice parameter decreased conversely. This was accompanied by an increase in T/sub c/ and H/sub c2/ (4.2 K), suggesting that the small diffusion spacing between Nb and Al facilitates the formation of the metastable A15 phase with stoichiometric composition. On the other hand, both the value of V-I curve and its field dependence decreased with decreasing Al core diameter below 50 nm, which suggests the sausaging of Al filaments in the heavily cold-worked sample. The reversible bending strain range was up to at least 1.4%, indicating the applicability of the react-and-wind method. The degradation in the J/sub c/ (4.2 K, 12 T) of the solenoid with 1.8% winding strain was about 20%. A decrease in temperature from 4.2 to 1.8 K caused an increase of H/sub c2/ by 2.5 T. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 2045 |
| Ending Page | 2048 |
| Page Count | 4 |
| File Size | 502066 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 27 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1991-03-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Niobium Capacitive sensors Conductors Superconducting magnets Magnetic cores Lattices Metastasis Degradation Solenoids Temperature |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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