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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Zani, M.Z. Luine, J.A. Lee, G.S. Murduck, J.M. Hu, R. Lewis, R.J.M.J. Davidheiser, R.A. Eaton, L.R. |
| Copyright Year | 1965 |
| Abstract | The behavior of HTS thin films patterned into microbridge DC and RF SQUID structures and irradiated with a rastered high-energy focused ion beam 70 mm in diameter is discussed. DC SQUIDs have demonstrated 51% modulation of the critical current with an applied magnetic field at 46 K. All devices with appropriate critical currents exhibited Shapiro steps when exposed to microwave irradiation. Multiple interference patterns, probably from weak links within each microbridge segment, are seen at 4 K and disappear at temperatures above liquid helium. The I/sub c/R/sub n/ product of the microbridges is typically a few millivolts, and the temperature dependence of the device resistance is consistent with electrical conduction through metallic filaments. The process demonstrates an acceptable yield and reliability for a variety of microelectronics applications. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 2557 |
| Ending Page | 2560 |
| Page Count | 4 |
| File Size | 864258 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 27 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1991-03-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Ion beams Critical current High temperature superconductors Transistors Radio frequency SQUIDs Magnetic modulators Magnetic fields Microwave devices Interference |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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