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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Reible, S.A. Wilker, C.W. |
| Copyright Year | 1965 |
| Abstract | An unique resonator structure for measuring RF surface losses in superconductive materials has been developed, and an absolute accuracy of 20% verified by measurements on copper films. The test structure utilizes two unpatterned, rectangular substrates which are pressed together by a spring-pressure arrangement, providing for short measurement turnaround times and rapid assessment of the microwave quality of high-temperature superconducting films. The unbalanced, parallel-plate transmission line structure is capacitively coupled to a pair of input/output leads. With 1-in-long MgO substrates the fundamental resonance is at about 2 GHz. An rms accuracy of several percent has been confirmed by a series of measurement results obtained with this structure on high-quality, superconducting films. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 2813 |
| Ending Page | 2816 |
| Page Count | 4 |
| File Size | 521982 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 27 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1991-03-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Radio frequency Loss measurement Transmission line measurements Superconducting films Superconductivity Superconducting materials Copper Testing Microwave measurements Superconducting transmission lines |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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