NDLI: Development of window CE driver of high speed ADC based on SPI

Content Provider	IEEE Xplore Digital Library
Author	Du Dongmei He Qing Tang Bin Chen Fei
Copyright Year	2009
Description	Author affiliation: Key Laboratory of Condition Monitoring and Control for Power Plant Equipment, Ministry of Education, School of Energy and Power Engineering, North China Electric Power University, Beijing 102206, China (Du Dongmei; He Qing; Tang Bin) \|\| School of Computer Science and Technology, North China Electric Power University, Beijing 102206, China (Chen Fei)
Abstract	A connection between the S3C2440, an ARM9-based 32-bit embedded MCU made by Samsung, and the ADS1274, a analog-to-digital converter with 24-bit, delta-sigma, data rates up to 128k samples per second, allowing simultaneous sampling of four channels made by Texas Instruments, is presented. The driver based on the Windows CE5.0 that is an embedded operating system has been developed. Using fast interruption (FIQ), the problem of high-speed transmission mass data between high-speed A/D converting and SPI serial interface has been solved. It is proved that the sampling frequency is up to the maximum of system and the sampled signal is accurate and reliable.
Starting Page	2034
Ending Page	2038
File Size	351269
Page Count	5
File Format	PDF
ISBN	9781424427222
DOI	10.1109/CCDC.2009.5192081
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-06-17
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Power engineering education Laboratories Driver Program Helium Data Acquisition SPI Condition monitoring Computer science Sampling methods Control engineering education Computer science education Embedded Systems Windows CE Power generation Power engineering and energy
Content Type	Text
Resource Type	Article

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