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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | King Wai Chiu Lai Fung, C.K.M. Hongzhi Chen Ruiguo Yang Bo Song Ning Xi |
| Copyright Year | 2010 |
| Description | Author affiliation: Electrical and Computer Engineering Department, Michigan State University College of Engineering, East Lansing, MI, 48824, USA (King Wai Chiu Lai; Fung, C.K.M.; Hongzhi Chen; Ruiguo Yang; Bo Song; Ning Xi) |
| Abstract | Researchers have been looking for novel materials to improve the performance of photonic devices. Graphene has great potential to optoelectronic applications because of its excellent optical properties. Here, we demonstrate using the graphene-based photodetectors for infrared detection under a zero-bias operation. We have demonstrated to use an electric-field-assisted method to manipulate graphene flake between metal microelectrodes successfully without the electron beam lithography. The devices are made from few-layer-graphene and multi-layer-graphene which are confirmed by Raman spectroscopy and atomic force microscopy. The size of the graphene flake can be as large as 15 μm × 15 μm. The obtained results demonstrate high potential applications of the electric-field-assisted technique and nano assembly to fabricate graphene-based infrared photodetectors. |
| Starting Page | 14 |
| Ending Page | 17 |
| File Size | 630618 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424488964 |
| e-ISBN | 9781424488971 |
| DOI | 10.1109/NMDC.2010.5652175 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-10-12 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Microelectrodes Microscopy Force Metals Nanoscale devices Photoconductivity |
| Content Type | Text |
| Resource Type | Article |
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