NDLI: On-line sensing and visual feedback for atomic force microscopy (AFM) based nano-manipulations

Content Provider	IEEE Xplore Digital Library
Author	Bo Song Ning Xi Ruiguo Yang King Wai Chiu Lai Chengeng Qu
Copyright Year	2010
Description	Author affiliation: Electrical and Computer Engineering Department, Michigan State University, East Lansing, MI, 48824 USA (Bo Song; Ning Xi; Ruiguo Yang; King Wai; Chiu Lai; Chengeng Qu)
Abstract	Atomic Force Microscopy (AFM) is a powerful and popular technique of single-molecule imaging both in air and liquid. Recent research and hardware development provide AFM with the function of manipulation nano-particle and modify sample surface in nano-scale. However, due to AFM usually takes several minutes to get an image and the surface change is hard to observe in real-time manipulation. In this paper, a novel approach for on-line sensing and display method is proposed and used for updating the surface change during the manipulation of cell. In this approach a cutting force detection model is used for cutting depth judgment. In addition, an adaptive local-scan strategy is involved here to get the topography of the local surface. Finally a display model is used to update the change of the surface during the manipulation. With this novel scheme the process of cell cutting become real-time visualized. So, AFM tip could work as an efficient nanolithography or cutting tool.
Starting Page	71
Ending Page	74
File Size	1963685
Page Count	4
File Format	PDF
ISBN	9781424488964
e-ISBN	9781424488971
DOI	10.1109/NMDC.2010.5651906
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-10-12
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Real time systems Visualization Force Surface topography Sensors Nanobioscience Surface treatment
Content Type	Text
Resource Type	Article

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