NDLI: Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test

Content Provider	IEEE Xplore Digital Library
Author	Suparjo, B. Ley, A. Cron, A. Ehrenberg, H.
Copyright Year	2006
Description	Author affiliation: Mentor Graphics Corp., San Jose, CA (Suparjo, B.)
Abstract	The IEEE Standard 1149.4 has been ratified and available for some time, now. However, describing the architectural content of an analog boundary-scan register has not yet been standardized. The work of the IEEE Std 1149.4 Working Group over the past several years has been to define and codify an extension to IEEE Std 1149.1 's BSDL. In this paper, a language to describe the boundary-scan implementation in a mixed-signal device is proposed. The language is called analog boundary-scan description language (ABSDL) and it is compatible with the existing IEEE Std 1149.1 BSDL. Using this language, test generation automation can proceed, and interconnect test on a mixed-signal board using analog boundary-scan cells can be performed to test both simple wires and discrete components between packaged devices with IEEE Std 1149.1 and 1149.4 infrastructure and access. Although not yet promulgated, the syntax definitions proposed in this paper are indicative of the current state of the Working Group's attempts at this effort. Along with the generation of the syntax for describing IEEE Std 1149.4 structures, the semantic checks for such an ABSDL file are presented
Starting Page	1
Ending Page	9
File Size	252331
Page Count	9
File Format	PDF
ISBN	1424402913
ISSN	10893539
DOI	10.1109/TEST.2006.297708
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-10-22
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Pins Automatic testing Integrated circuit interconnections Switches Electronic equipment testing Measurement standards Graphics Automation LAN interconnection
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test

On-chip mixed-signal test structures re-used for board test

The integration of boundary-scan test methods to a mixed-signal environment

Towards a test standard for board and system level mixed-signal interconnects

Hierarchical test approach using boundary scan test

Proposal to simplify development of a mixed signal test standard

Testing digital circuits using a Mixed-Signal Automatic Test Equipment

PXI Express Based JTAG / Boundary Scan ATE for Structural Board and System Test

A boundary-scan test bus controller design for mixed-signal test

Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test

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Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test

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Hierarchical test approach using boundary scan test

Proposal to simplify development of a mixed signal test standard

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