NDLI: A Robust, Self-Tuning CMOS Circuit for Built-in Go/No-Go Testing of Synthesizer Phase Noise

Content Provider	IEEE Xplore Digital Library
Author	Erdogan, E.S. Ozev, S.
Copyright Year	2006
Description	Author affiliation: Dept. of Electr. & Comput. Eng., Duke Univ. (Erdogan, E.S.; Ozev, S.)
Abstract	As one way of reducing the reliance on mixed signal testers for circuits with small analog content, researchers have proposed built-in self-test (BiST) techniques that target specific parameters of analog circuits. Most BiST techniques for phase locked loops (PLL) aim at measuring the timing jitter through precise on-chip clocks and/or additional computation of measured specs. In this paper, we propose a built-in test circuit to perform go/no-go testing for in-band PLL phase noise. Our circuit measures the band-limited, low frequency noise power at the input of the voltage controlled oscillator (VCO) which is translated as the high frequency phase noise at the output of the PLL. Our circuit contains a self calibration sequence based on a simple sinusoidal input to make it robust to process variations. The circuit is implemented using 0.8mum CMOS process with the equivalent area of roughly 800 2-input minimum size NAND gates. Monte Carlo simulations have confirmed that the test circuit can robustly detect noise levels that are above the specified fail level
Starting Page	1
Ending Page	10
File Size	11376957
Page Count	10
File Format	PDF
ISBN	1424402913
ISSN	10893539
DOI	10.1109/TEST.2006.297696
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-10-22
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Noise robustness Automatic testing Synthesizers Phase noise Phase locked loops Phase measurement Built-in self-test Voltage-controlled oscillators Analog circuits
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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