NDLI: A Study of Implication Based Pseudo Functional Testing

Content Provider	IEEE Xplore Digital Library
Author	Syal, M. Chandrasekar, K. Vimjam, V. Hsiao, M.S. Yi-Shing Chang Chakravarty, S.
Copyright Year	2006
Abstract	This paper presents a study of the implication based functional constraint extraction techniques to generate pseudo functional scan tests. Novel algorithms to extract pair-wise and multi-node constraints as Boolean expressions on arbitrary gates in the design are presented. Its impact on reducing the overkill in testing was analyzed, and report the trade-offs in coverage and scan-loads for a number of fault models. In the case of path-delay fault model, it was shown that the longest paths contribute most to the over-testing problem, raising the question about scan testing of the longest paths. Finally, the evaluation of the functional constraints on large industrial circuits show that the proposed constraint generation algorithm generate a powerful set of constraints most of which are not captured in the constraints extracted by designers for design-verification purposes
Starting Page	1
Ending Page	10
File Size	324770
Page Count	10
File Format	PDF
ISBN	1424402913
ISSN	10893539
DOI	10.1109/TEST.2006.297667
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-10-22
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Circuit faults Automatic test pattern generation Algorithm design and analysis Design for testability Power generation Fault diagnosis State-space methods Binary decision diagrams Computational modeling
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in