NDLI: Structural Testing of High-Speed Serial Buses: A Case Study Analysis

Content Provider	IEEE Xplore Digital Library
Author	Johnson, E.
Copyright Year	2006
Description	Author affiliation: ASSET InterTech, Inc., San Jose, CA (Johnson, E.)
Abstract	As the speed of serial buses breaks into multi-gigabits per second (Gb/S), current structural testing methodologies break down. Direct physical access to buses is becoming impossible due to board layout constraints. Even when access is achievable, the signal measured at the probe point may be significantly different than the signal received at the chip. In addition, when a probe can be placed on a test point, the added capacitance caused by the probe can distort the signal, masking design problems or reporting erroneous faults. Because these difficulties will only increase as bus speeds increase and as more buses lose physical access, engineers are faced with identifying alternative strategies for maintaining sufficient test coverage. Recognizing this situation, Intelreg developed a technology called Intelreg interconnect built-in self test (Intelreg IBIST) (Nejedlo, 2003 and Nejelo, 2003), which is being embedded into next-generation processors and chipsets. This case study examines the use of Intel IBIST to test circuit boards on an Intel based server. To perform the experiments, the Intel IBIST facilities were accessed via the board's boundary-scan (IEEE 1149.1/JTAG) port. Data was gathered to validate fault detection and diagnostics. In addition, data generated by the experiment are compared with current methods of testing, such as probing with an oscilloscope
Starting Page	1
Ending Page	9
File Size	297118
Page Count	9
File Format	PDF
ISBN	1424402913
ISSN	10893539
DOI	10.1109/TEST.2006.297737
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-10-22
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Probes Distortion measurement Semiconductor device measurement Capacitance Signal design Circuit faults Maintenance engineering Integrated circuit interconnections Automatic testing
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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