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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Junghwan Lee OSung Kwon Liangjun Zhang Sung-eui Yoon |
| Copyright Year | 2012 |
| Description | Author affiliation: Dept. of CS, Stanford University, USA (Liangjun Zhang) || Dept. of CS, KAIST, Daejeon, South Korea (Junghwan Lee; OSung Kwon) || Dept. of CS, KAIST, Korea (Sung-eui Yoon) |
| Abstract | We present a novel retraction-based planner, selective retraction-based RRT, for efficiently handling a wide variety of environments that have different characteristics. We first present a bridge line-test that can identify regions around narrow passages, and then perform an optimization-based retraction operation selectively only at those regions. We also propose a non-colliding line-test, a dual operator to the bridge line-test, as a culling method to avoid generating samples near wide-open free spaces and thus to generate more samples around narrow passages. These two tests are performed with a small computational overhead and are integrated with a retraction-based RRT. In order to demonstrate benefits of our method, we have tested our method with different benchmarks that have varying amounts of narrow passages. Our method achieves up to 21 times and 3.5 times performance improvements over a basic RRT and an optimization-based retraction RRT, respectively. Furthermore, our method consistently improves the performances of other tested methods across all the tested benchmarks that have or do not have narrow passages. |
| Starting Page | 2543 |
| Ending Page | 2550 |
| File Size | 1486332 |
| Page Count | 8 |
| File Format | |
| ISBN | 9781467314039 |
| ISSN | 10504729 |
| e-ISBN | 9781467314053 |
| e-ISBN | 9781467314046 |
| DOI | 10.1109/ICRA.2012.6224928 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-05-14 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Bridges Benchmark testing Principal component analysis Planning Probabilistic logic Robots Algorithm design and analysis |
| Content Type | Text |
| Resource Type | Article |
| Subject | Artificial Intelligence Control and Systems Engineering Electrical and Electronic Engineering Software |
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