NDLI: Routine quality control of computer designed and fabricated intensity modulation filters

Content Provider	IEEE Xplore Digital Library
Author	Provost, D. Dunscombe, P. Lederer, E. Leszczynski, K.
Copyright Year	2000
Abstract	For anatomy compensating filters the authors' approach is to confirm the shape in the two dimensions perpendicular to the beam axis by visual inspection and confirm the third dimension parallel to the beam) at one point, corresponding to the Helax reference point, by direct relative dose measurement. This approach has proved satisfactory in the over 100 pairs of filters designed by Helax and fabricated by the Compuformer. The authors' routine quality control results together with their initial commissioning measurements indicate a high degree of reliability in the fabrication of these filters. However, for modulating filters to be used in IMRT, the authors' present quality control protocol will have to be extended. Visual inspection of the milled but unfilled mould is likely to be of little value as it will not be possible to relate the modulation of the filter and hence the photon fluence to surface anatomy. Profiler measurements have been shown here to be of adequate accuracy to confirm the filter profile in one dimension. Added confidence in the accuracy of fabrication of an IMRT filter could be gained by measuring several linear profiles although,it has to be remembered that such measurements and the associated Helax calculations do absorb resources. Ideally, however, verification of modulating filters for IMRT will employ an area detector such as an electronic portal imager which, with known dose response characteristics, could yield the two dimensional profile of the filter.
Starting Page	214
Ending Page	217
File Size	260887
Page Count	4
File Format	PDF
ISBN	0780364651
ISSN	1094687X
DOI	10.1109/IEMBS.2000.900709
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-07-23
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Quality control Anatomy Shape measurement Inspection Fabrication Gain measurement Protocols Optical modulation Nonlinear filters Detectors
Content Type	Text
Resource Type	Article

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