NDLI: Warning: Launch off Shift Tests for Delay Faults May Contribute to Test Escapes

Content Provider	IEEE Xplore Digital Library
Author	Zhuo Zhang Reddy, S.M. Pomeranz, I.
Copyright Year	2007
Description	Author affiliation: Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA (Zhuo Zhang)
Abstract	Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift test method has the advantage that it provides higher fault coverage at reduced test generation time and test pattern counts. However a concern expressed often in the literature is the potential over testing or yield loss caused by the fact that launch off shift operates the circuit under test in non-functional manner. In this paper we present data, for the first time, which points to another potential problem with launch off shift tests. The data presented for ISCAS-89 benchmark circuits shows that a considerable numbers of functionally detectable transition delay faults are not detected by the normally used launch off shift tests that use a single fault activation cycle. Functionally detectable faults that escape tests could cause circuit malfunction in normal operation. Thus launch off shift tests when used in manufacturing test may result in test escapes. We also present data that shows that if launch off shift tests with multiple fault activation cycles are used essentially all functionally detectable faults can be detected.
Starting Page	817
Ending Page	822
File Size	224694
Page Count	6
File Format	PDF
ISBN	1424406293
DOI	10.1109/ASPDAC.2007.358090
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-01-23
Publisher Place	Japan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Delay Circuit testing Circuit faults Fault detection Electrical fault detection Manufacturing Lab-on-a-chip Cities and towns Test pattern generators Benchmark testing
Content Type	Text
Resource Type	Article

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