NDLI: The dependence of the microstructure and magnetic properties of CoNiCr/Cr thin films on the substrate temperature

Content Provider	IEEE Xplore Digital Library
Author	Duan, S.L. Artman, J.O. Wong, B. Laughlin, D.E.
Copyright Year	1965
Abstract	Thin CoNiCr/Cr films (candidates for longitudinal recording media) were deposited on Corning 7059 glass substrate by RF diode sputtering. The CoNiCr layer thickness was fixed at 40 nm; the Cr layer thickness, d/sub Cr/, ranged between 60 and 400 nm. At d/sub Cr/=170 nm, when the substrate temperature before deposition, T/sub s/, was set below 100 degrees C, both the Cr underlayer and the CoNiCr layer were more or less randomly oriented. When specimens were deposited at T/sub s/>or=200 degrees C, the Cr layer was strongly [100] textured and the CoNiCr layer exhibited a strongly preferred texture. This CoNiCr texture is epitaxially favored by the Cr [100] texture. With increasing d/sub Cr/ the Cr [110] texture increased and the CoNiCr texture decreased. The grain size increased with T/sub s/ and d/sub Cr/. In-plane coercivity, H/sub c/, initially increased with T/sub s/ to peak at T/sub s/=200 degrees C. As T/sub s/ was increased further from 200 to 260 degrees C, H/sub c/ decreased. The squareness and saturation magnetization were not sensitive to T/sub s/.<>
Sponsorship	IEEE Magnetics Society
Starting Page	1587
Ending Page	1589
Page Count	3
File Size	353517
File Format	PDF
ISSN	00189464
Volume Number	26
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1990-09-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Microstructure Magnetic properties Chromium Substrates Magnetic films Magnetic recording Glass Radio frequency Diodes Sputtering
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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