NDLI: In situ measurements of the coercive force of thin film discs-a comparison of different techniques

Content Provider	IEEE Xplore Digital Library
Author	Pressesky, J.L. Lee, S.Y.
Copyright Year	1965
Abstract	Three critical-current detection schemes are compared for demagnetization effects: DC erase, initial pattern: 75 fc/mm: DC erase, initial pattern: 450 fc/mm; reverse DC erase (noise amplitude vs. reverse DC erase current); and amplitude saturation (isolated-pulse amplitude vs. write current). An analysis of the error between the coercivity estimated by the critical current and the coercivity as measured by a vibrating sample magnetometer allows inferences to be made concerning the effect of demagnetizing fields in each of these critical-current detection methods. In most of the cases considered, the demagnetization effects appeared to be independent of the demagnetizating ratio, and may thus be represented by a constant offset term to an otherwise linear relationship between critical current and remanent coercivity. The results obtained with regard to the DC/noise technique are somewhat contradictory with respect to results published by other investigators, but this may be due to the intrinsically low media noise of the CoCrTa media presently used.<>
Sponsorship	IEEE Magnetics Society
Starting Page	2472
Ending Page	2474
Page Count	3
File Size	355093
File Format	PDF
ISSN	00189464
Volume Number	26
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1990-09-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Force measurement Coercive force Transistors Demagnetization Critical current Noise level Error analysis Magnetic analysis Current measurement Magnetic field measurement
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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