NDLI: Thickness and roughness dependence of DC modulation noise in thin film magnetic recording disk media

Content Provider	IEEE Xplore Digital Library
Author	Katti, R.R. Saunders, D.A.
Copyright Year	1965
Abstract	DC modulation noise was studied as a function of magnetic-layer thickness and surface roughness for longitudinal, low-noise, nominally 1000-Oe, plated CoP and CoNiZnP, thin-film magnetic recording disk media made from controlled fabrication runs. DC modulation noise is generated when a reverse longitudinal DC field is applied to a uniformly magnetized disk. A model which allows autocorrelation functions and noise spectra to be calculated and which agrees with measured noise data (with correlations greater than 0.99) was developed. Trends observed with measured data and the model indicate that inhomogeneities in the medium, and not surface roughness, are the dominant sources of noise.<>
Sponsorship	IEEE Magnetics Society
Starting Page	2712
Ending Page	2714
Page Count	3
File Size	384349
File Format	PDF
ISSN	00189464
Volume Number	26
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1990-09-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Magnetic noise Magnetic modulators Rough surfaces Surface roughness Magnetic field measurement Noise measurement Magnetic films Magnetic recording Thickness control Fabrication
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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