NDLI: Improved bias and stability in dual-exchange-biased unshielded magnetoresistive heads

Content Provider	IEEE Xplore Digital Library
Author	Cain, W.C. Kryder, M.H.
Copyright Year	1965
Abstract	Data are presented on dual-exchange-biased NiFe-TbCo UMR (unshielded magnetoresistive) tape heads with improved signal response and process stability. It was found that a Si/sub 3/N/sub 4/ passivation layer offered better stability of the exchange bias through head processing than SiO/sub 2/. In order to improve sensor sensitivity, the longitudinal component of the exchange bias was reduced by increasing the exchange angle to 75 degrees from the sense current direction. This resulted in a +6-dB improvement in signal over previous heads without sacrificing Barkhausen-noise-free operation in narrow trackwidths. Heads with trackwidths as narrow as 8 mu m were shown to operate at linear densities of up to 50 kFCI with excellent signal-to-noise ratios (>45 dB). Investigations of different passivation materials showed Si/sub 3/N/sub 4/ to provide the best protection against environmental corrosion and thermally induced oxidation of the TbCo layer.<>
Sponsorship	IEEE Magnetics Society
Starting Page	2412
Ending Page	2414
Page Count	3
File Size	282291
File Format	PDF
ISSN	00189464
Volume Number	26
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1990-09-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Stability Magnetoresistance Magnetic heads Passivation Pollution measurement Magnetic sensors Magnetic domains Magnetic field measurement Protection Acceleration
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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