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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Nishimori, K. Tanaka, K. Sato, K. |
| Copyright Year | 1965 |
| Abstract | The influence of surface contamination on sputtered carbon films on a rigid thin-film disk was evaluated with LEPS (low-energy photoelectron spectroscopy) and XPS (X-ray photoelectron spectroscopy). LEPS was as sensitive as XPS for detecting the surface contaminant. LEPS had the advantage of operating in an ambient atmosphere, while XPS was useful for the identification of the chemical species of the contaminant. The XPS analysis revealed that the main contaminant was due to water in air. XPS showed that the wettability of the fluorocarbon lubricant decreased with an increase in the exposure time of the sputtered carbon film to air before lubrication or with a surface-contaminant increase on the sputtered carbon film.< |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 2508 |
| Ending Page | 2510 |
| Page Count | 3 |
| File Size | 353075 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 26 |
| Issue Number | 5 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1990-09-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Surface contamination Energy measurement Pollution measurement Atmosphere Lubricants Magnetic films Spectroscopy Sputtering Rough surfaces Surface roughness |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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