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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Oprins, H. Cherman, V. Torregiani, C. Stucchi, M. Vandevelde, B. Beyne, E. |
| Copyright Year | 2010 |
| Description | Author affiliation: IMEC, Kapeldreef 75, 3001 Leuven, Belgium (Oprins, H.; Cherman, V.; Torregiani, C.; Stucchi, M.; Vandevelde, B.; Beyne, E.) |
| Abstract | 3D stacking of dies is a promising technique to allow miniaturization and performance enhancement of electronic systems. The complexity of the interconnection structures, combined with the reduced thermal spreading in the thinned dies and the poorly thermally conductive adhesives complicate the thermal behaviour of a stacked die structure. The same dissipation will lead to higher temperatures and a more pronounced temperature peak in a stacked die package compared to a single die package. Therefore, the thermal behaviour in a 3D-IC needs to be studied thoroughly. In this paper, a test vehicle to assess power dissipation in multiple hot spots and the thermal impact of TSVs, is presented. In this test vehicle, a stack of test chips with integrated heaters and temperature sensors is used to evaluate the steady state and transient temperature profile of multiple hot spots. With this experimental set-up, the thermal modelling of the 3D stacks is validated. |
| Starting Page | 1 |
| Ending Page | 6 |
| File Size | 1503938 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781424485536 |
| e-ISBN | 9781424485550 |
| e-ISBN | 9781424485543 |
| DOI | 10.1109/ESTC.2010.5642955 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-09-13 |
| Publisher Place | Germany |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Temperature measurement Analytical models Semiconductor device measurement Solid modeling Power measurement thermal modelling Heating Numerical models experimental characterization thermal aware design 3D stacked ICs |
| Content Type | Text |
| Resource Type | Article |
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