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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Yibing Shi Longfu Zhou Wei Zhang |
| Copyright Year | 2009 |
| Description | Author affiliation: School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China (Yibing Shi; Longfu Zhou; Wei Zhang) |
| Abstract | A new soft-fault diagnosis approach for analog circuit with parameter tolerance is proposed in this paper. The approach uses fuzzy nonlinear programming (FNLP) concept to diagnose analog circuit under test quantitatively. Node-voltage incremental equations, as constraints of FNLP equation, are built based on the sensitivity analysis. Through evaluating the parameters deviations from the solution of the FNLP equation, it can be stated that whether the actual parameters are within tolerance ranges or some components are faulty. Examples illustrate the proposed approach and show its effectiveness. |
| Starting Page | 1078 |
| Ending Page | 1081 |
| File Size | 793024 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424448869 |
| DOI | 10.1109/ICCCAS.2009.5250333 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-07-23 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Manufacturing industries Fault diagnosis Nonlinear equations Costs Sensitivity analysis Voltage Analog circuits Linear programming Circuit faults Circuit testing |
| Content Type | Text |
| Resource Type | Article |
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