NDLI: Fault diagnosis for linear analog circuits with symbolic analysis and reduced observable point set

Content Provider	IEEE Xplore Digital Library
Author	Artioli, M. Filippetti, F.
Copyright Year	2001
Description	Author affiliation: Dipt. di Ingegneria Elettrica, Bologna Univ., Italy (Artioli, M.)
Abstract	The paper is intended to propose a simple method to locate and identify, single (and multiple, under some hypothesis) faults in linear electric circuits. Key points of the method are: (1) a simple idea for an easy implementation, (2) a formulation based on symbolic analysis to use the feature of automatically generating equations and its ability to incorporate "non-conventional" algebra, (3) an extension to the interval algebra to take into account parameter tolerances and uncertainties for real circuits, (4) the need of few observable test points to meet real testing requirements as far as possible. The focus is primarily kept on the mathematical formulation, relating to the symbolic approach and the intervals.
Sponsorship	IEEE Comput. Soc. Test Technol. Tech. Council
Starting Page	215
Ending Page	218
File Size	344978
Page Count	4
File Format	PDF
ISBN	0769512909
DOI	10.1109/OLT.2001.937845
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-07-09
Publisher Place	Italy
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault diagnosis Analog circuits Circuit analysis Circuit faults Circuit testing Voltage Equations Algebra Linear circuits Electrical fault detection
Content Type	Text
Resource Type	Article

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