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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Vasan, B.K. Jingbo Duan Chen Zhao Geiger, R.L. Chen, D.J. |
| Copyright Year | 2009 |
| Description | Author affiliation: Department of Electrical and Computer Engineering, Iowa State University. (Vasan, B.K.; Jingbo Duan; Chen Zhao; Geiger, R.L.; Chen, D.J.) |
| Abstract | Conventional approach to linearity testing of ADCs requires a signal generator that is more linear than the device under test (DUT). Recently introduced ADC testing algorithms dramatically relax the linearity requirements on the signal generator in exchange for maintaining a known functional relationship between two unknown nonlinear test signals. Simple signal generators that can be used to generate the two non-linear signals are discussed. Simulation results show that the generated signals can be used to test ADCs with resolution ranging between 6 and 17bits. |
| Starting Page | 113 |
| Ending Page | 116 |
| File Size | 569322 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424438969 |
| DOI | 10.1109/ECCTD.2009.5274967 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-08-23 |
| Publisher Place | Turkey |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Costs Automatic testing Linearity Voltage Built-in self-test Signal generators Data mining Signal resolution Analog-digital conversion Signal design |
| Content Type | Text |
| Resource Type | Article |
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