NDLI: Power and temperature requirements for refrigerated systems

Content Provider	IEEE Xplore Digital Library
Author	Copeland, D. Chan, A.
Copyright Year	2004
Description	Author affiliation: Fujitsu Lab. of America, Packaging Technol. Res., Sunnyvale, CA, USA (Copeland, D.; Chan, A.)
Abstract	As feature dimensions of processors shrink to 100 nanometers and smaller, leakage current becomes a significant part of total power dissipation. The magnitude of power dissipated as leakage current can approach half that of the active current at higher junction temperatures. Leakage current exhibits a strong exponential relationship with temperature. Reduction of junction temperatures from a traditional value of 85 C to a near-ambient value of 25 C can reduce leakage current to a fraction of its usual value, and total power by nearly one-third. Representative leakage current models were chosen for 100, 85 and 65 nm technologies, projected for the years 2003, 2005 and 2007. Using these models, power reduction was calculated for a range of cold plate temperatures from 15 to 25 C. This was compared to compressor power in the same range. When static leakage is 30% at 85 C, total power is lowest at the highest cold plate temperature. When static leakage is 50% at 85 C, the total power becomes nearly constant throughout the range of cold plate temperatures.
Sponsorship	Components, Packaging and Manufacturing Technol. Soc. of the Inst. of Elec. and Electron. Eng
Starting Page	237
Ending Page	241
File Size	356698
Page Count	5
File Format	PDF
ISBN	0780383575
DOI	10.1109/ITHERM.2004.1319180
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-06-01
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Refrigeration Leakage current Temperature sensors Power dissipation Cold plates Temperature dependence Temperature distribution Workstations Cooling Packaging
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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